TY  - BOOK
AU  - DiNardo,Nicholas John
TI  - Nanoscale characterization of surfaces and interfaces
SN  - 3527292470
U1  - 502.825 
PY  - 1994///
CY  - Weinheim [u.a.]
PB  - VCH
KW  - Surfaces (Physics)
KW  - Analysis
KW  - Scanning tunneling microscopy
N1  - Literaturverzeichnis Seite 151-158
UR  - http://www.gbv.de/dms/ilmenau/toc/152310088.PDF
ER  -