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Electron probe quantitation [a result of a gathering on international experts in 1988 at ... National Institute of Standards and Technology, NIST] ed. by K. F. J. Heinrich and Dale E. Newbury

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TextLanguage: English Publisher: New York [u.a.] Plenum Press 1991Description: VIII, 400 S Ill., graph. DarstContent type:

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Holdings
Item type	Current library	Call number	Materials specified	Status	Date due	Barcode
Buch	MPI CPfS	UH 6310 ELEC (Browse shelf(Opens below))		Available		10002548

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Previous	UH 6300 TRANS Transmission electron energy loss spectrometry in materials science symposium was held February 17, 1991 at the TMS Annual Meeting in New Orleans, Louisiana	UH 6300 WATT The principles and practice of electron microscopy	UH 6310 EGGE Standardfreie Elektronenstrahl-Mikroanalyse mit dem EDX im Rasterelektronenmikroskop ; ein Handbuch für die Praxis	UH 6310 ELEC Electron probe quantitation [a result of a gathering on international experts in 1988 at ... National Institute of Standards and Technology, NIST]	UH 6310 PRAC Practical scanning electron microscopy electron and ion microprobe analysis	UH 6310 PRAX Praxis der Rasterelektronenmikroskopie und Mikrobereichsanalyse	UH 6310 PRAX +2 Praxis der Rasterelektronenmikroskopie und Mikrobereichsanalyse	Next

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