Rietveld refinement practical powder diffraction pattern analysis using TOPAS Robert E. Dinnebier, Andreas Leineweber, John S.O. Evans
Material type:
TextLanguage: English Series: De Gruyter STEMPublisher: Berlin Boston De Gruyter [2019]Copyright date: © 2019Description: XVI, 331 Seiten Illustrationen, Diagramme 24 cm x 17 cmContent type: - Text
- ohne Hilfsmittel zu benutzen
- Band
- 9783110456219
- 3110456214
- 530.411
- 548.83
- 530
- VG 9900
- VG 9901
- UQ 5400
- *82-02
- 82D25
- 00A79
- 33.61
- 38.31
| Item type | Current library | Call number | Materials specified | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|
| Buch | MPI CPfS | VG 9901 DINN (Browse shelf(Opens below)) | Checked out | 2025-08-01 | 8426-10 |
Browsing MPI CPfS shelves Close shelf browser (Hides shelf browser)
| VG 9900.1 SHMU Introduction to crystallographic statistics | VG 9900.1 TIME Time-resolved diffraction | VG 9900.1 XRAY X-ray diffraction at elevated temperatures a method for in situ process analysis | VG 9901 DINN Rietveld refinement practical powder diffraction pattern analysis using TOPAS | VG 9901 DUNI X-ray analysis and the structure of organic molecules | VG 9901 STOU X-ray structure determination a practical guide | VG 9901 ZACH Theory of x-ray diffraction in crystals |
Literaturangaben