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Aberration-corrected imaging in transmission electron microscopy an introduction Rolf Erni

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TextLanguage: English Publisher: London Imperial College Pr. 2010Description: XII, 335 S. Ill., graph. DarstContent type:

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Holdings
Item type	Current library	Call number	Materials specified	Status	Date due	Barcode
Buch	MPI CPfS	UH 6300 ERNI (Browse shelf(Opens below))		Available		10006032

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Previous	UH 6300 DE Introduction to conventional transmission electron microscopy	UH 6300 EGER Physical principles of electron microscopy an introduction to TEM, SEM and AEM	UH 6300 ENER Energy-filtering transmission electron microscopy	UH 6300 ERNI Aberration-corrected imaging in transmission electron microscopy an introduction	UH 6300 FULT Transmission electron microscopy and diffractometry of materials	UH 6300 FULT Transmission electron microscopy and diffractometry of materials	UH 6300 KLEM Electron optics	Next

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