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Analytical electron microscopy for materials science D. Shindo; T. Oikawa

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TextLanguage: English Publisher: Tokyo Berlin Heidelberg [u.a.] Springer 2002Description: IX, 152 S Ill., graph. Darst 27 cmContent type:

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Holdings
Item type	Current library	Call number	Materials specified	Status	Date due	Barcode
Buch	MPI CPfS	UH 6300 SHIN (Browse shelf(Opens below))		Available (Dauerausleihe)		10005745
Buch	MPI CPfS			storniert		6693-10

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Previous	UH 6300 SAMP -2 Sample preparation handbook for transmission electron microscopy [2] Techniques	UH 6300 SCAN Scanning microscopy for nanotechnology techniques and applications	UH 6300 SCAN Scanning transmission electron microscopy imaging and analysis	UH 6300 SHIN Analytical electron microscopy for materials science	UH 6300 SLAY Light and electron microscopy	UH 6300 THOM Analytische Transmissionselektronenmikroskopie eine Einführung für den Praktiker	UH 6300 TRANS Transmission electron energy loss spectrometry in materials science symposium was held February 17, 1991 at the TMS Annual Meeting in New Orleans, Louisiana	Next

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