Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis Patrick Echlin
Material type:
TextLanguage: English Publisher: New York, NY Springer 2009Description: XI, 330 S. Ill., graph. Darst. 26 cmContent type: - Text
- ohne Hilfsmittel zu benutzen
- Band
- 9780387857305
- 502.285
- QH212.S3
- UH 6300
- UH 6310
- 44.46
- 42.03
- 33.18
- 33.05
- 35.30
- 3
| Item type | Current library | Call number | Materials specified | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|
| Buch | MPI CPfS | VG 9900 ECHL (Browse shelf(Opens below)) | Available | 10005514 |
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| VG 9900 CRYS +3 Crystal structure refinement a crystallographer's guide to SHELXL | VG 9900 CRYS +4 Crystal structure refinement a crystallographer's guide to SHELXL | VG 9900 CRYS +5 Crystal structure refinement a crystallographer's guide to SHELXL | VG 9900 ECHL Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis | VG 9900 EGER Electron energy-loss spectroscopy in the electron microscope | VG 9900 GOOD Electron microscopy and analysis | VG 9900 GUBI X-ray line profile analysis in materials science |
Literaturverz. S. 317 - 322
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