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Light and electron microscopy Elizabeth M. Slayter; Henry S. Slayter

By:

Slayter, Elizabeth M [aut]

Contributor(s):

Slayter, Henry S [aut]

Material type: Text

TextLanguage: English Publisher: Cambridge Cambridge Univ. Pr. 2000Edition: Repr., transferred to digital printingDescription: XVI, 312 S. graph. DarstContent type:

Text

Media type:

ohne Hilfsmittel zu benutzen

Carrier type:

Band

ISBN:

0521327148
0521339480

Subject(s):

DDC classification:

578.4

Other classification:

UH 6300
WC 2900

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Holdings ( 1 )

Holdings
Item type	Current library	Call number	Materials specified	Status	Date due	Barcode
Buch	MPI CPfS	UH 6300 SLAY (Browse shelf(Opens below))		Available		10004889

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Previous	UH 6300 SCAN Scanning microscopy for nanotechnology techniques and applications	UH 6300 SCAN Scanning transmission electron microscopy imaging and analysis	UH 6300 SHIN Analytical electron microscopy for materials science	UH 6300 SLAY Light and electron microscopy	UH 6300 THOM Analytische Transmissionselektronenmikroskopie eine Einführung für den Praktiker	UH 6300 TRANS Transmission electron energy loss spectrometry in materials science symposium was held February 17, 1991 at the TMS Annual Meeting in New Orleans, Louisiana	UH 6300 WATT The principles and practice of electron microscopy	Next

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Light and electron microscopy Elizabeth M. Slayter; Henry S. Slayter

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