Fundamentals of powder diffraction and structural characterization of materials by Vitalij K. Pecharsky; Peter Y. Zavalij
Material type:
- Text
- ohne Hilfsmittel zu benutzen
- Band
- 0387241477
- 0387245677
- X-rays -- Diffraction -- Measurement
- Powders -- Optical properties -- Measurement
- X-rays -- Diffraction -- Measurement
- Powders -- Optical properties -- Measurement
- X-ray crystallography
- Pulvermethode
- Kristallstrukturanalyse
- Röntgenstrukturanalyse
- Röntgenstrukturanalyse
- Pulvermethode
- Röntgendiffraktometrie
- Pulvermethode
- Kristallstrukturanalyse
- 548.83
- QC482.D5P43 2005
- QC482.D5
- 13
- VG 9900
- 35.90
- 38.31
- 3
Item type | Current library | Call number | Materials specified | Status | Date due | Barcode | |
---|---|---|---|---|---|---|---|
Buch | MPI CPfS | UQ 5100 PECH +2 (Browse shelf(Opens below)) | Checked out | 2025-07-31 | 10003971 | ||
CD-ROM | MPI CPfS | CD-ROM [UQ 5100 PECH +2] (Browse shelf(Opens below)) | Available | 10003972 | |||
Buch | MPI CPfS | UQ 5100 PECH (Browse shelf(Opens below)) | Available | 10003710 | |||
CD-ROM | MPI CPfS | CD-ROM [UQ 5100 PECH] (Browse shelf(Opens below)) | Checked out | 2025-07-31 | 10003711 |
Originally published: Boston : Kluwer Academic Publishers, c2003
Includes bibliographical references and index
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