High resolution X-ray diffractometry and topography D. Keith Bowen and Brian K. Tanner
Material type:
TextLanguage: English Publisher: London [u.a.] Taylor & Francis 2001Edition: ReprDescription: X, 252 S. Ill., graph. DarstContent type: - Text
- ohne Hilfsmittel zu benutzen
- Band
- 0850667585
- 548/.83
- UQ 5600
| Item type | Current library | Call number | Materials specified | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|
| Buch | MPI CPfS | UQ 5100 BOWE (Browse shelf(Opens below)) | Available | 10001181 |
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| UQ 5100 AZAR +2 Elements of x-ray crystallography | UQ 5100 BENN Understanding single-crystal X-ray crystallography | UQ 5100 BERT Principles and practice of x-ray spectrometric analysis | UQ 5100 BOWE High resolution X-ray diffractometry and topography | UQ 5100 BUER X-ray crystallography an introd. to the investigation of crystals by their diffraction of monochromatic x-radiation | UQ 5100 CULL Elements of x-ray diffraction | UQ 5100 EGAM Underneath the bragg peaks structural analysis of complex materials |