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Practical scanning electron microscopy electron and ion microprobe analysis ed. by Joseph I. Goldstein ...

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Material type: Text

TextPublisher: New York [u.a.] Plenum Pr. 1976Edition: 2. printDescription: XVIII, 582 S. Ill., graph. DarstContent type:

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Holdings
Item type	Current library	Call number	Materials specified	Status	Date due	Barcode
Buch	MPI CPfS	UH 6310 PRAC (Browse shelf(Opens below))		Available		10000685

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Previous	UH 6300 WATT The principles and practice of electron microscopy	UH 6310 EGGE Standardfreie Elektronenstrahl-Mikroanalyse mit dem EDX im Rasterelektronenmikroskop ; ein Handbuch für die Praxis	UH 6310 ELEC Electron probe quantitation [a result of a gathering on international experts in 1988 at ... National Institute of Standards and Technology, NIST]	UH 6310 PRAC Practical scanning electron microscopy electron and ion microprobe analysis	UH 6310 PRAX Praxis der Rasterelektronenmikroskopie und Mikrobereichsanalyse	UH 6310 PRAX +2 Praxis der Rasterelektronenmikroskopie und Mikrobereichsanalyse	UH 6310 SARI Scanning force microscopy with applications to electric, magnetic, and atomic forces	Next

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