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Electron energy-loss spectroscopy in the electron microscope R. F. Egerton

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TextLanguage: English Publisher: New York, NY [u.a.] Plenum Press 1996Edition: 2. edDescription: XI, 485 S. Ill., graph. DarstContent type:

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Holdings
Item type	Current library	Call number	Materials specified	Status	Date due	Barcode
Buch	MPI CPfS	VG 9900 EGER (Browse shelf(Opens below))		Available		10002531

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Previous	VG 9900 CRYS +4 Crystal structure refinement a crystallographer's guide to SHELXL	VG 9900 CRYS +5 Crystal structure refinement a crystallographer's guide to SHELXL	VG 9900 ECHL Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis	VG 9900 EGER Electron energy-loss spectroscopy in the electron microscope	VG 9900 GOOD Electron microscopy and analysis	VG 9900 GUBI X-ray line profile analysis in materials science	VG 9900 KLUG X-ray diffraction procedures for polycrystalline and amorphous materials	Next

Previous ed.: 1986. - Bibliography: p439-479. - Includes index

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