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Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid

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TextLanguage: English Series: Oxford series on optical sciences ; 5Publisher: New York, NY [u.a.] Oxford Univ. Press 1994Edition: Rev. edDescription: XIII, 263 S. Ill., graph. DarstContent type:

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Holdings
Item type	Current library	Call number	Materials specified	Status	Date due	Barcode
Buch	MPI CPfS	UH 6310 SARI (Browse shelf(Opens below))		Available		10002671

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Previous	UH 6310 PRAC Practical scanning electron microscopy electron and ion microprobe analysis	UH 6310 PRAX Praxis der Rasterelektronenmikroskopie und Mikrobereichsanalyse	UH 6310 PRAX +2 Praxis der Rasterelektronenmikroskopie und Mikrobereichsanalyse	UH 6310 SARI Scanning force microscopy with applications to electric, magnetic, and atomic forces	UH 6320 CHEN Introduction to scanning tunneling microscopy	UH 6320 CHEN Introduction to scanning tunneling microscopy	UH 6320 HAUG Atomic force microscopy understanding basic modes and advanced applications	Next

Previous ed.: 1991. - Literaturverz. S. 233 - 259

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