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Practical scanning electron microscopy electron and ion microprobe analysis [Hrsg.] Joseph I. Goldstein

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TextLanguage: English Publisher: New York [u.a.] Plenum Press 1977Edition: 3. printDescription: 582 SContent type:

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Holdings
Item type	Current library	Call number	Materials specified	Status	Date due	Barcode
Buch	MPI CPfS	VG 9900.0 PRAC (Browse shelf(Opens below))		Available		10001908

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Previous	VG 9900.0 IN +2 In situ scanning electron microscopy in materials research	VG 9900.0 KIRK Advanced computing in electron microscopy	VG 9900.0 KIRK Advanced computing in electron microscopy	VG 9900.0 PRAC Practical scanning electron microscopy electron and ion microprobe analysis	VG 9900.0 REIM Transmission electron microscopy physics of image formation and microanalysis	VG 9900.0 REIM Scanning electron microscopy physics of image formation and microanalysis	VG 9900.0 SCAN Scanning electron microscopy and X-ray microanalysis a text for biologists, materials scientists, and geologists	Next

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