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Introduction to scanning tunneling microscopy C. Julian Chen

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Material type: Text

TextLanguage: English Series: Oxford series on optical sciences ; 4Publisher: New York, NY [u.a.] Oxford Univ. Press 1993Description: XXII, 412 S. Ill., graph. DarstContent type:

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Additional physical formats: Erscheint auch als: Introduction to scanning tunneling microscopy; Erscheint auch als: Introduction to scanning tunneling microscopyDDC classification:

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Includes bibliographical references (p. 383 - 404) and index

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Holdings
Item type	Current library	Call number	Materials specified	Status	Date due	Barcode
Buch	MPI CPfS	UH 6320 CHEN (Browse shelf(Opens below))		Available		10000687

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Previous	UH 6310 PRAX Praxis der Rasterelektronenmikroskopie und Mikrobereichsanalyse	UH 6310 PRAX +2 Praxis der Rasterelektronenmikroskopie und Mikrobereichsanalyse	UH 6310 SARI Scanning force microscopy with applications to electric, magnetic, and atomic forces	UH 6320 CHEN Introduction to scanning tunneling microscopy	UH 6320 CHEN Introduction to scanning tunneling microscopy	UH 6320 HAUG Atomic force microscopy understanding basic modes and advanced applications	UH 6320 MAGO Surface analysis with STM and AFM experimental and theoretical aspects of image analysis	Next

Includes bibliographical references (p. 383 - 404) and index

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