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Scanning electron microscopy physics of image formation and microanalysis

Reimer, Ludwig 1928-

Scanning electron microscopy physics of image formation and microanalysis Ludwig Reimer - 2., completely rev. and updated ed. - XIV, 527 S Ill., graph. Darst - Springer series in optical sciences 45 . - Springer series in optical sciences 45 .

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ISBN: 3540639764 (Gb.) 9783642083723

Standard No.: 9783642083723 9783540639763

LCCN: 98026178

Nat. Bib. No.: 98,N34,0443 dnb 98,A47,0832 dnb

Nat. Bib. Agency Control No.: 953703797 DE-101

Subjects--Topical Terms:
Scanning electron microscopy

LC Class. No.: QH212.S3

Dewey Class. No.: 502.825 502/.8/25 535/.3325

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Scanning electron microscopy physics of image formation and microanalysis